Optimization of Thickness and Number of Layers for CdTe Films Deposited by Stacked Elemental Layers Method and Annealed in Different Environments | ||
| Egyptian Journal of Solids | ||
| Article 2, Volume 34, Issue 2, 2011, Pages 19-28 PDF (392.9 K) | ||
| DOI: 10.21608/ejs.2011.148868 | ||
| Abstract | ||
| Thin films of CdTe were deposited by stacked elemental layers method on glass substrate. The effect of different evaporation parameters upon the structural and optical properties has been investigated by using X-ray diffraction and optical spectrophotometry measurements. X-ray data were collected and crystal structure analyses were performed using Rietveld refinement method. In the present study the thickness of the films was varied in the range 100 - 300 nm, additionally the layers were adjusted in range between 3-5 layers. Furthermore, the films were annealed at 200 oC for 30 minutes in different environments. X-ray diffractograms showed that films annealed in vacuum exhibit only a single CdTe phase while multiphase films were obtained for films annealed in air. The results show that decreasing of the film thickness and/or increasing of the number of stacked layers enhances the phase purity of the films. Optical energy gaps (1.36 - 1.51 eV) were estimated from the manipulation of transmission and reflection data. The analysis of structural and optical data revealed optimum conditions for obtaining high quality films (single phase) that the thickness is 200 nm and the number of layers is five. | ||
|
Statistics Article View: 80 PDF Download: 155 |
||
