ESTIMATION OF SOME GENETIC PARAMETERS IN BREAD WHEAT CROSSES USING DIALLEL ANALYSIS | ||
| Egyptian Journal of Plant Breeding | ||
| Volume 23, Issue 7, November and December 2019, Pages 1437-1454 PDF (664.82 K) | ||
| Document Type: Original research | ||
| DOI: 10.12816/ejpb.2019.256693 | ||
| Abstract | ||
| A half diallel analysis of eight bread wheat, parents [Shandaweel 1(P1), Sids 12 (P2), Giza 168 (P3), Gemmiza 9 (P4), Sids 4 (P5) as local cultivars and three lines (Line 11(P6), Line 13(P7) and line 26 (P8)) from (CIMMYT)]. The 28 F1 and 28 F2 which were drived from the crosses between the parents, were carried out at Mallawy Agricultural Research Station, ARC, during three successive seasons of 2013/2014, 2014/2015 and 2015/2016 to estimate the genetic prameters of flag leaf area (cm2), grain filling rate (g day-1), no. of spikes plant-1, no. of kernels spike-1, grain yield plant-1 (g) and 100-kernel weight (g). The analysis of variance revealed that mean squares due to genotypes were highly significant for all of these characters. Also, the non-additive gene effect was important than the additive gene effect for most traits. The degree of dominance was over-dominance for all traits except for no. of kernels spike-1 was partial dominance. Moderate narrow sense heritability was observed in all traits in F2 generations. The lowest value of inbreeding depression was observed in cross Sids 12×Giza 168. Grain yield plant-1 had strong correlation with grain filling rate and no. of spikes plant-1, and also between flag leaf area and 100-kernel weight. The parent Sids 12 had a maximum domininat genes for flag leaf area, grain yield plant-1, no. of spikes plant-1, 100-kernel weight and grain filling rate, beside Line 13 for grain filling rate. These two promising genotypes can be used as a donors in multiple traits breeding programme to develop high yielding wheat genotypes. | ||
| Keywords | ||
| Wheat (Triticum aestivum L.); Diallel; Heritability; Inbreeding depression; Correlation; Grain yield; Additive-dominance model | ||
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