Abdel-Razek, A., Karkhanis, V. (1974). Predicting of A Reliability Function from A Wide Spectrum of Time-To-Failure Distribution. test, 18(2), 73-86. doi: 10.21608/esju.1974.315764
A. Abouel-Nour Abdel-Razek; Vijaykumar J. Karkhanis. "Predicting of A Reliability Function from A Wide Spectrum of Time-To-Failure Distribution". test, 18, 2, 1974, 73-86. doi: 10.21608/esju.1974.315764
Abdel-Razek, A., Karkhanis, V. (1974). 'Predicting of A Reliability Function from A Wide Spectrum of Time-To-Failure Distribution', test, 18(2), pp. 73-86. doi: 10.21608/esju.1974.315764
Abdel-Razek, A., Karkhanis, V. Predicting of A Reliability Function from A Wide Spectrum of Time-To-Failure Distribution. test, 1974; 18(2): 73-86. doi: 10.21608/esju.1974.315764

Predicting of A Reliability Function from A Wide Spectrum of Time-To-Failure Distribution

The Egyptian Statistical Journal
Article 1, Volume 18, Issue 2, December 1974, Pages 73-86
Document Type: Original Article
DOI: 10.21608/esju.1974.315764
Authors
A. Abouel-Nour Abdel-Razek; Vijaykumar J. Karkhanis
Abstract
A general mathematical expression is developed as a time-to-failure distribution to incorporate exponential, chi-square, gamma, and Weibull distributions. A function «PTILES» is defined with the intention of partitioning the cumulative distribution function of the general model into two additive parts. One of these two parts is the reliability function of a Weibull distribution which can easily be transformed into a straight line on a special graph paper designed for this purpose.
Keywords
A Time; To; Failure Distribution; Weibull Distributions
Statistics
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