Khan, R., Kulshrestha, A., Khan, M. (2015). Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization. test, 23(3), 558-562. doi: 10.1016/j.joems.2014.11.003
R.U. Khan; A. Kulshrestha; M.A. Khan. "Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization". test, 23, 3, 2015, 558-562. doi: 10.1016/j.joems.2014.11.003
Khan, R., Kulshrestha, A., Khan, M. (2015). 'Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization', test, 23(3), pp. 558-562. doi: 10.1016/j.joems.2014.11.003
Khan, R., Kulshrestha, A., Khan, M. Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization. test, 2015; 23(3): 558-562. doi: 10.1016/j.joems.2014.11.003

Relations for moments of k-th record values from exponential-Weibull lifetime distribution and a characterization

Journal of the Egyptian Mathematical Society
Volume 23, Issue 3, 2015, Pages 558-562    PDF (431.44 K)
Document Type: Original Article
DOI: 10.1016/j.joems.2014.11.003
Authors
R.U. Khan* ; A. Kulshrestha; M.A. Khan
Department of Statistics and Operations Research, Aligarh Muslim University, Aligarh 202 002, India
Abstract
In this note we give some recurrence relations satisfied by single and product moments of
k-th upper record values from the exponential-Weibull lifetime distribution. Using a recurrence
relation for single moments we obtain a characterization of exponential-Weibull, Weibull,
exponential, Rayleigh and two parameter linear failure rate distributions. 
Keywords
KEYWORDS Order statistics; k-th upper record values; Exponential-Weibull distribution; Single moments; Product moments; Recurrence relations and characterization
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